材料科学与工程著作系列：微观组织的分析电子显微学表征（英文版）

作者: 戎咏华著

出版社: 高等教育出版社

出版时间: 2012-01

版次: 1

ISBN: 9787040300925

定价: 119.00

装帧: 精装

开本: 16开

纸张: 胶版纸

页数: 552页

字数: 820千字

正文语种: 英语

分类: 工程技术

11人买过

《材料科学与工程著作系列：微观组织的分析电子显微学表征（英文版）》介绍了分析电子显微学（AEM）的基本概念和操作技术，聚集于相恋和形变中位错的AEM研究。同时通过大量的例子阐述衍射晶体学的物理概念和数学分析方法，例如相变中位向关系的定量预测等，以便读者加深理解和拓展视野。
《材料科学与工程著作系列：微观组织的分析电子显微学表征（英文版）》可作为材料科学与工程以及凝聚态物理领域的学者和研究生的参考书。戎咏华，上海交通大学材料科学与工程学院教授。 Chapter1AnalyticalElectronMicroscope（AEM）
1.1BriefintroductionofAEMhistory
1.2InteractionbetweenelectronsandspecimenandsignalsusedbyAEM
1.3Electronwavelengthandelectromagneticlens
1.3.1Electronwavelength
1.3.2Electromagneticlens
1.4StructureandfunctionofAEM
1.4.1Illuminationsystem
1.4.2Specimenholders
1.4.3Imagingsystem
1.4.4Imagerecording
1.4.5Powersupplysystemandvacuumsystem
1.4.6Computercontrol'
1.5Theprincipleofimaging,magnifyinganddiffracting
1.6Theoreticalresolutionlimit
1.7Depthoffocusanddepthoffield
1.8Sphericalaberration-c0rrectedTEMsReferences

Chapter2SpecimenPreparation
2.1Traditionaltechniques
2.1.1Replica
2.1.2Preparationofpowders
2.1.3Filmpreparationforplanview
2.1.4Filmpreparationfromabulkmetallicsample.
2.1.5Filmpreparationfromabulknonmetalticsample.
2.2Specialtechniques
2.2.1Cross-sectionalspecimenpreparation
2.2.2Cleavingandsmallanglecleavagetechnique
2.2.3Ultramicrotomy
2.2.4FocusedionbeamtechniqueReferences

Chapter3ElectronDiffraction
3.1ComparisonofelectrondiffractionwithX-raydiffraction
3.2Conditionsofdiffraction
3.2.1Geometriccondition
3.2.2Physicalcondition
3.2.3DiffractiondeviatingfromexactBraggCondition
3.3Basicequationusedforanalysisofelectrondiffractionpattern
3.3.1Diffractioninanelectrondiffractometer
3.3.2DiffractioninaTEM
3.4Principleandoperationofselectedareaelectrondiffraction
3.5Rotationofimagerelativetodiffractionpattern
3.6Diffractionpatternsofpolycrystalandtheirapplications
3.6.1Formationandgeometricfeaturesofdiffractionpatternsforpolycrystal
3.6.2Applicationsofringpatterns
3.7Geometricfeaturesofdiffractionpatternsofsinglecrystals
3.7.1Geometricfeaturesanddiffractionintensityofasinglecrystalpattern
3.7.2Indexingmethodsofsinglecrystaldiffractionpatterns
3.8Mainapplicationsofsinglecrystalpattern
3.8.1Identificationofphases
3.8.2Determinationoforientationrelationship
3.9Diffractionspotshiftbystackingfaultsanddeterminationofstackingfaultprobability
3.9.1Diffractionfromplanardefect
3.9.2DeterminationofstackingfaultprobabilityinHCPcrystal
3.9.3DeterminationofstackingfaultprobabilityinFCCcrystal
3.10Systematictiltingtechniqueanditsapplications
3.10.1Systematictiltingtechniquebydoubletiltholder.
3.10.2Determinationofelectronbeamdirection
……
Chapter4MathematicsAnalysisinElectronDiffractionandCrystallography
Chapter5DiffractionContrast
Chapter6highResolutionandHighSpatialResolutionofAnalyticaelectronMicroscopy
Appendix
Index
内容简介:
《材料科学与工程著作系列：微观组织的分析电子显微学表征（英文版）》介绍了分析电子显微学（AEM）的基本概念和操作技术，聚集于相恋和形变中位错的AEM研究。同时通过大量的例子阐述衍射晶体学的物理概念和数学分析方法，例如相变中位向关系的定量预测等，以便读者加深理解和拓展视野。
《材料科学与工程著作系列：微观组织的分析电子显微学表征（英文版）》可作为材料科学与工程以及凝聚态物理领域的学者和研究生的参考书。
作者简介:
戎咏华，上海交通大学材料科学与工程学院教授。
目录:
Chapter1AnalyticalElectronMicroscope（AEM）
1.1BriefintroductionofAEMhistory
1.2InteractionbetweenelectronsandspecimenandsignalsusedbyAEM
1.3Electronwavelengthandelectromagneticlens
1.3.1Electronwavelength
1.3.2Electromagneticlens
1.4StructureandfunctionofAEM
1.4.1Illuminationsystem
1.4.2Specimenholders
1.4.3Imagingsystem
1.4.4Imagerecording
1.4.5Powersupplysystemandvacuumsystem
1.4.6Computercontrol'
1.5Theprincipleofimaging,magnifyinganddiffracting
1.6Theoreticalresolutionlimit
1.7Depthoffocusanddepthoffield
1.8Sphericalaberration-c0rrectedTEMsReferences

Chapter2SpecimenPreparation
2.1Traditionaltechniques
2.1.1Replica
2.1.2Preparationofpowders
2.1.3Filmpreparationforplanview
2.1.4Filmpreparationfromabulkmetallicsample.
2.1.5Filmpreparationfromabulknonmetalticsample.
2.2Specialtechniques
2.2.1Cross-sectionalspecimenpreparation
2.2.2Cleavingandsmallanglecleavagetechnique
2.2.3Ultramicrotomy
2.2.4FocusedionbeamtechniqueReferences

Chapter3ElectronDiffraction
3.1ComparisonofelectrondiffractionwithX-raydiffraction
3.2Conditionsofdiffraction
3.2.1Geometriccondition
3.2.2Physicalcondition
3.2.3DiffractiondeviatingfromexactBraggCondition
3.3Basicequationusedforanalysisofelectrondiffractionpattern
3.3.1Diffractioninanelectrondiffractometer
3.3.2DiffractioninaTEM
3.4Principleandoperationofselectedareaelectrondiffraction
3.5Rotationofimagerelativetodiffractionpattern
3.6Diffractionpatternsofpolycrystalandtheirapplications
3.6.1Formationandgeometricfeaturesofdiffractionpatternsforpolycrystal
3.6.2Applicationsofringpatterns
3.7Geometricfeaturesofdiffractionpatternsofsinglecrystals
3.7.1Geometricfeaturesanddiffractionintensityofasinglecrystalpattern
3.7.2Indexingmethodsofsinglecrystaldiffractionpatterns
3.8Mainapplicationsofsinglecrystalpattern
3.8.1Identificationofphases
3.8.2Determinationoforientationrelationship
3.9Diffractionspotshiftbystackingfaultsanddeterminationofstackingfaultprobability
3.9.1Diffractionfromplanardefect
3.9.2DeterminationofstackingfaultprobabilityinHCPcrystal
3.9.3DeterminationofstackingfaultprobabilityinFCCcrystal
3.10Systematictiltingtechniqueanditsapplications
3.10.1Systematictiltingtechniquebydoubletiltholder.
3.10.2Determinationofelectronbeamdirection
……
Chapter4MathematicsAnalysisinElectronDiffractionandCrystallography
Chapter5DiffractionContrast
Chapter6highResolutionandHighSpatialResolutionofAnalyticaelectronMicroscopy
Appendix
Index